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<dc:title xml:lang="en">Terahertz time-domain ellipsometry based on spintronic phenomena</dc:title>
<dcterms:alternative xml:lang="fr">Ellipsométrie temporelle térahertz basée sur des phénomènes spintroniques</dcterms:alternative>
<dc:subject xml:lang="fr">Émetteur spintronique</dc:subject>
<dc:subject xml:lang="fr">Ellipsométrie</dc:subject>
<dc:subject xml:lang="fr">Rayonnement térahertz</dc:subject>
<dc:subject xml:lang="fr">Spectroscopie résolue en temps</dc:subject>
<dc:subject xml:lang="fr">Spintronique</dc:subject>
<dc:subject xml:lang="fr">Photomélangeurs</dc:subject>
<dc:subject xml:lang="en">Spintronic emitter</dc:subject>
<dc:subject xml:lang="en">Elllipsometry</dc:subject>
<dc:subject xml:lang="en">Terahertz radiation</dc:subject>
<dc:subject xml:lang="en">Time-Domain spectroscopy</dc:subject>
<dc:subject xml:lang="en">Spintronics</dc:subject>
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<tef:elementdEntree autoriteExterne="031694276" autoriteSource="Sudoc">Ellipsométrie</tef:elementdEntree>
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<tef:vedetteRameauNomCommun>
<tef:elementdEntree autoriteExterne="028884353" autoriteSource="Sudoc">Rayonnement terahertz</tef:elementdEntree>
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<tef:vedetteRameauNomCommun>
<tef:elementdEntree autoriteExterne="031811485" autoriteSource="Sudoc">Spectroscopie résolue en temps</tef:elementdEntree>
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<tef:elementdEntree autoriteExterne="113932766" autoriteSource="Sudoc">Spintronique</tef:elementdEntree>
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<dcterms:abstract xml:lang="fr">L'ellipsométrie, technique clé en science des matériaux, caractérise précisément les propriétés optiques, l'épaisseur et la composition. Son extension au domaine térahertz (THz) permet de sonder la conductivité et la dynamique des porteurs, essentielles pour les avancées en semi-conducteurs, stockage d'énergie et télécommunications ultra-rapides. Toutefois, les méthodes actuelles d'ellipsométrie THz adaptent l'ellipsométrie optique traditionnelle sans exploiter pleinement les capacités uniques de la spectroscopie temporelle. Elles offrent des descriptions de polarisation incomplètes et peinent à contrôler précisément la polarisation, limitant l'analyse de matériaux anisotropes et manquant d'informations complètes d'amplitude et de phase pour une caractérisation exhaustive.Cette thèse surmonte ces limitations en développant une nouvelle ellipsométrie spectroscopique complète dans le domaine temporel THz (THz-cTDSE). Notre système capture amplitude et phase, déterminant les matrices complètes de Jones et de Mueller pour des échantillons anisotropes. Pour simplifier l'interprétation des données complexes, nous avons introduit les coefficients exponentiels de Pauli, représentant intuitivement les réponses en polarisation comme le retard et la d'atténuation pour toutes les polarisations—jusqu'ici inaccessibles expérimentalement. De plus, nous avons développé une calibration robuste compensant les désalignements, éliminant le besoin d'un alignement précis des composants et améliorant ainsi la précision et la fiabilité des mesures pour de nombreux systèmes ellipsométriques.Pour un contrôle de polarisation raffiné, nous utilisons des émetteurs térahertz spintroniques (STE), offrant une émission large bande de polarisation linéaire, contrôlable via un champ magnétique avec de hauts rapports d'extinction. Nous présentons la première application expérimentale des STE pour le contrôle de polarisation en ellipsométrie. Pour maximiser leur potentiel, nous avons développé des émetteurs générant des signaux robustes avec des méthodes avancées de contrôle de polarisation : en intégrant les STE à des cavités photoniques, nous avons maximisé l'absorption du pompage, atteignant une augmentation de 8?dB—une des plus élevées rapportées—facilitant des mesures plus rapides et une meilleure qualité de données. En incorporant des cavités résonantes THz, nous avons doublé l'extraction THz grâce à une interférence constructive, menant à une amélioration estimée à 15?dB. Nous avons également conçu une anisotropie magnétique uniaxiale dans les STE via une trilame ferromagnétique pour un contrôle précis de la polarisation sur 360°, essentiel pour une ellipsométrie exacte, et développé des mécanismes de polarisation contrôlés par tension utilisant des émetteurs magnétostrictifs, franchissant une étape clé vers des systèmes STE intégrés.Reconnaissant le potentiel des STE pour les applications en domaine fréquentiel grâce à leur réponse spectrale ultrarapide et uniforme, nous avons étendu notre travail au-delà du domaine temporel. Nous avons démontré un concept de photomélangeurs spintroniques hautement accordables avec une efficacité stable en fréquence, surmontant les limitations des photomélangeurs conventionnels. En générant des peignes de fréquences jusqu'à 1,05?THz, nous avons mis en évidence la polyvalence des STE, ouvrant de nouvelles possibilités pour des applications THz accordables et à haute résolution.Ce travail établit une plateforme robuste pour la caractérisation précise des matériaux en THz, faisant progresser significativement la science des matériaux et les technologies associées. En exploitant la sensibilité à la polarisation, notre système THz-cTDSE offre des insights profonds sur les propriétés matérielles, stimulant des innovations dans les diagnostics non invasifs, la fabrication d'hétérostructures, le contrôle qualité et le développement de nouveaux matériaux.</dcterms:abstract>
<dcterms:abstract xml:lang="en">Ellipsometry is a foundational technique in materials science, enabling precise characterization of optical properties, thickness, and composition. Extending ellipsometry into the terahertz (THz) range unlocks new opportunities to probe fundamental material characteristics such as conductivity and carrier dynamics—key for advancements in semiconductors, energy storage, and ultra-fast telecommunications. However, existing THz ellipsometry methods often adapt traditional optical ellipsometry without fully exploiting the unique capabilities of time-domain spectroscopy. These systems result in incomplete polarization descriptions and face challenges in achieving high-quality polarization control due to the limitations of THz components. Consequently, they are insufficient for analyzing general anisotropic materials, lacking complete amplitude and phase information essential for comprehensive characterization.This dissertation overcomes these limitations by developing a novel terahertz complete time-domain spectroscopic ellipsometry (THz-cTDSE). Our system captures both amplitude and phase information, determining the full Jones and Mueller matrices of anisotropic samples. Ellipsometry often requires advanced expertise in interpreting complex matrix data; therefore, we introduced Pauli exponential coefficients, which intuitively represent polarization responses such as retardation and diattenuation across all linear, diagonal, and circular polarizations—until now experimentally unattainable due to the absence of complete coherent ellipsometry. Furthermore, we developed a robust calibration technique compensating for misalignments and eliminating the need for precise component alignment, enhancing measurement accuracy and reliability applicable to many ellipsometric systems.To address the requirement for refined polarization, we employ spintronic terahertz emitters (STEs), which provide broadband, gapless emission of linear polarization that is easily controllable via a magnetic field and offers high extinction ratios. We present the first experimental application of STEs for polarization control in ellipsometry. To fully leverage the potential of STEs, we developed emitters capable of generating robust signals with advanced methods for polarization control: (i) By integrating STEs with photonic cavities, we maximized pump absorption within the STE layers, achieving an 8dB increase—one of the highest reported enhancements—facilitating faster measurements and improved data quality. Additionally, we incorporated THz resonant cavities, enabling constructive interference that doubles the THz extraction, leading to an overall estimated improvement of 15dB. (ii) We engineered uniaxial magnetic anisotropy in STEs using a ferromagnetic trilayer for advanced polarization control, enabling precise 360° polarization rotation essential for accurate ellipsometry. Additionally, we developed voltage-controlled polarization mechanisms using magnetostrictive emitters, marking a crucial step toward fully integrable STE systems.Recognizing the potential of STEs' ultrafast and uniform spectral response for frequency-domain applications, we extended our work beyond the time domain. We demonstrated a proof-of-concept for highly tunable spintronic photomixers with frequency-stable efficiency, overcoming limitations of conventional photomixers that suffer efficiency loss at higher frequencies. By generating sustained frequency combs up to 1.05~THz, we showcased the versatility of STEs and unlocked new possibilities for high-resolution, tunable THz applications.This work establishes a robust platform for precise THz material characterization, significantly advancing materials science and technologies. By leveraging polarization sensitivity, our THz-cTDSE system offers deeper insights into material properties, driving innovations in non-invasive diagnostics, heterostructure fabrication, quality control, and the development of novel materials.</dcterms:abstract>
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<dc:title xml:lang="en">Fully reversible magnetoelectric voltage controlled THz polarization rotation in magnetostrictive spintronic emitters on PMN-PT</dc:title>
<dc:creator>Geoffrey Lezier</dc:creator>
<dc:creator>Pierre Koleják</dc:creator>
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<dc:title xml:lang="en">Effects of optical activity to Mueller matrix ellipsometry of composed waveplates</dc:title>
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